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Full characterization of ultrathin 5-nm low- k dielectric bilayers: Influence of dopants and surfaces on the mechanical properties

Ultrathin films and multilayers, with controlled thickness down to single atomic layers, are critical for advanced technologies ranging from nanoelectronics to spintronics to quantum devices. However, for thicknesses less than 10 nm, surfaces and dopants contribute significantly to the film properties, ...

by Brad Sohnlein

Tags: High Harmonic, XUUS, Ti:Sapphire, Semiconductor, EUV, extreme ultraviolet source, nanostructures, materials characterization, ultrafast spectroscopy

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Margaret Murnane – Tabletop X-ray lasers

Prof. Margaret Murnane, Physics, fellow, JILA, University of Colorado, Boulder

KMLabs co-founder Murnane's lecture is about tabletop X-ray lasers. Ever since the invention of the laser, 50 years ago, researchers have also tried to develop lasers for X-rays. The aim is to better concentrate and direct ...

by Margaret Murnane

Tags: High Harmonic, XUUS

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