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Attosecond light science and its application for probing quantum materials

In this paper, the authors review the development and application of coherent short wavelength light sources implemented using the high harmonic generation (HHG) process, such as the KMLabs by Brad Sohnlein

Tags: High Harmonic, XUUS, Ti:Sapphire, HHG, Coherent Diffractive Imaging, Mask Inspection, Phase Retrieval, X-Ray Imaging, Semiconductor, EUV, imaging, lithography, nanoscale characterization, semiconductor technology, VUV, ARPES, time-resolved ARPES, extreme ultraviolet source, materials characterization, quantum, soft X-ray, surface-to-near-surface, ultrafast spectroscopy

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Full characterization of ultrathin 5-nm low- k dielectric bilayers: Influence of dopants and surfaces on the mechanical properties

Ultrathin films and multilayers, with controlled thickness down to single atomic layers, are critical for advanced technologies ranging from nanoelectronics to spintronics to quantum devices. However, for thicknesses less than 10 nm, surfaces and dopants contribute ...

by Brad Sohnlein

Tags: High Harmonic, XUUS, Ti:Sapphire, HHG, Semiconductor, EUV, imaging, nanoscale characterization, semiconductor technology, extreme ultraviolet source, nanostructures, materials characterization, surface-to-near-surface, ultrafast spectroscopy

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Generation of above-terawatt 1.5-cycle visible pulses at 1 kHz by post-compression in a hollow fiber

Rouzee and colleagues at the Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy report on the generation of 6.1 mJ, 3.8 fs pulses by the compression of a kilohertz KMLabs Ti:sapphire laser in a ...

by Brad Sohnlein

Tags: High Harmonic, Ti:Sapphire, EUV, extreme ultraviolet source, ultrafast spectroscopy

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Ultrafast 1 MHz vacuum-ultraviolet source via highly cascaded harmonic generation in negative-curvature hollow-core fibers

The vacuum ultraviolet (VUV) spectral region, covering approximately 6–15 eV, has a unique ability to probe physical and chemical processes.  This range of the electromagnetic spectrum is often used as an ionization source in angle-resolved photoelectron spectroscopy (ARPES) and photoionization mass ...

by Brad Sohnlein

Tags: nanoscale characterization, photon absorption, VUV, ARPES, time-resolved ARPES, PIM, chemical combustion, materials characterization, spectroscopy, ultrafast spectroscopy, ytterbium fiber, Atom Probe Tomography, highly cascaded harmonic generation

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Low-Frequency Vibrational Motions of Polystyrene in Carbon Tetrachloride: Comparison with Model Monomer and Dependence on Concentration and Molecular Weight

Studies on the molecular dynamics of polymers in solution often use longer time scales due to the size of the macromolecules being studied. To fully elucidate the complete dynamics and interactions of polymers in solution, however, it is necessary to also study the ultrafast (sub-picosecond) dynamics as well. In ...

by Brad Sohnlein

Tags: Ti:Sapphire, spectroscopy, ultrafast spectroscopy

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Femtosecond Laser Spectroscopy, Autocorrelation, and Second Harmonic Generation: An Experiment for Undergraduate Students

With the increase in integrated photonics careers, it is essential that students in undergraduate institutions gain experience with equipment, techniques, and ideas used in the field.  In this paper, an upper level undergraduate lab is designed utilizing a KMLabs by Brad Sohnlein

Tags: Ti:Sapphire, Dispersion, spectroscopy, ultrafast spectroscopy, Teaching Lab

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Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

3D pulsed laser atom probe tomography (APT)  is an atomic scale materials characterization and 3D imaging method utilizing ultrafast pulses to induce photon assisted field ion evaporation in certain materials. Currently, modern APT measurements employ coherent, pulsed near ultraviolet (NUV) light to induce ...

by Brad Sohnlein

Tags: High Harmonic, XUUS, Ti:Sapphire, HHG, EUV, extreme ultraviolet source, materials characterization, spectroscopy, ultrafast spectroscopy, Atom Probe Tomography

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