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Attosecond light science and its application for probing quantum materials

In this paper, the authors review the development and application of coherent short wavelength light sources implemented using the high harmonic generation (HHG) process, such as the KMLabs by Brad Sohnlein

Tags: High Harmonic, XUUS, Ti:Sapphire, HHG, Coherent Diffractive Imaging, Mask Inspection, Phase Retrieval, X-Ray Imaging, Semiconductor, EUV, imaging, lithography, nanoscale characterization, semiconductor technology, VUV, ARPES, time-resolved ARPES, extreme ultraviolet source, materials characterization, quantum, soft X-ray, surface-to-near-surface, ultrafast spectroscopy

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Full characterization of ultrathin 5-nm low- k dielectric bilayers: Influence of dopants and surfaces on the mechanical properties

Ultrathin films and multilayers, with controlled thickness down to single atomic layers, are critical for advanced technologies ranging from nanoelectronics to spintronics to quantum devices. However, for thicknesses less than 10 nm, surfaces and dopants contribute ...

by Brad Sohnlein

Tags: High Harmonic, XUUS, Ti:Sapphire, HHG, Semiconductor, EUV, imaging, nanoscale characterization, semiconductor technology, extreme ultraviolet source, nanostructures, materials characterization, surface-to-near-surface, ultrafast spectroscopy

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Generation of above-terawatt 1.5-cycle visible pulses at 1 kHz by post-compression in a hollow fiber

Rouzee and colleagues at the Max Born Institute for Nonlinear Optics and Short Pulse Spectroscopy report on the generation of 6.1 mJ, 3.8 fs pulses by the compression of a kilohertz KMLabs Ti:sapphire laser in a ...

by Brad Sohnlein

Tags: High Harmonic, Ti:Sapphire, EUV, extreme ultraviolet source, ultrafast spectroscopy

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Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

3D pulsed laser atom probe tomography (APT)  is an atomic scale materials characterization and 3D imaging method utilizing ultrafast pulses to induce photon assisted field ion evaporation in certain materials. Currently, modern APT measurements employ coherent, pulsed near ultraviolet (NUV) light to induce ...

by Brad Sohnlein

Tags: High Harmonic, XUUS, Ti:Sapphire, HHG, EUV, extreme ultraviolet source, materials characterization, spectroscopy, ultrafast spectroscopy, Atom Probe Tomography

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